Jeez I thought you were finally going to actually do what you keep saying and stop replying to this topic that you have no interest in..but here you are again... If you had not noticed YOU are the ONLY one arguing in the face of facts while providing no facts yourself. Says it all. Your right, not sure why anyone thought that facts and science had a place on a forum like this. If I did not know better, I would guess that you believe consoles have a pre destined life span that is set when they come off the production line, and that temperature can have no effect on that so 70 degrees or 60 degrees makes no difference. I completely get it, you don't care if your console runs at 60 degrees or 70 degrees, and that is fairly normal...That makes you the same as 90% of other console users so congrats on that, you went with the majority, and if this was a vote your side would have won. BUT the FACTS simply don't care about your feelings or opinions, it literally makes no difference. For anyone who is interested here are a few more links. The fact that heat is the main enemy of computers is undisputed as far as I know (apart from the big rebel Filipe of course). I could easily find 100 links to support this, I doubt there will be many people agreeing that higher temperature makes no difference. https://www.ijera.com/papers/Vol7_issue5/Part-5/H0705055257.pdf http://www.apiste-global.com/enc/technology_enc/detail/id=1262 https://thermal-edge.com/how-temperature-control-in-electrical-enclosures-affects-component-life/ Spoiler  William Vigrass, “Calculation of Semiconductor Failure Rates”, https://www.intersil.com/content/da...alculation_of_semiconductor_failure_rates.pdf (accessed July 2017)  Ross Wilcoxon, “Advanced Cooling Techniques and Thermal Design Procedures for Airborne Electronic Equipment – Revisited” 2016 IMAPS Thermal Management Advanced Technology Workshop, Los Gatos, CA, October, 2016  Patrick O’Connor, “Arrhenius and Electronics Reliability”, Quality and Reliability Engineering International, V. 5, N. 255, 1989, http://onlinelibrary.wiley.com/doi/10.1002/ qre.4680050402/pdf (accessed July 2017)  Clemens Lasance, “Temperature and reliability in electronics systems – the missing link”, Electronics Cooling Magazine, November 1, 2001; https://electronics-cooling.com/200...lity-in-electronics-systems-the-missing-link/ (accessed July 2017)  Michael Osterman , “We still have a headache with Arrhenius”, Electronics Cooling Magazine, February 2001; https:// www.electronics-cooling.com/2001/02/we-still-have-a-headache-with-arrhenius/ (accessed July 2017)  Franck Bayle and Adamantios Mettas, “Temperature Acceleration Models in Reliability Predictions: Justification & Improvements”, “2010 Reliability and Maintainability Symposium,”; San Jose CA, USA; January 2010  Mark Cooper, “Investigation of Arrhenius Acceleration Factor for Integrated Circuit Early Life Failure Region with Several Failure Mechanisms”, IEEE Trans. on Comp. and Pack. Tech., V. 28, N. 3, September 2005, pp. 561-563  Jean Yang-Scharlotta , et al., “Reliability Characterization of a Commercial TaOX-based ReRAM”, Integrated Reliability Workshop Final Report (IIRW), 2014 IEEE International, South Lake Tahoe, CA, October 2014  V.Lakshminarayanan and N.Sriraam, “The Effect of Temperature on the Reliability of Electronic Components”, Electronics, Computing and Communication Technologies (IEEE CONECCT), 2014 IEEE International Conference on; Bangalore, India; February 2014  George Meyer and Ross Wilcoxon, “Heat Pipe Reliability Testing and Life Prediction”,2015 IMAPS Thermal Management Advanced Technology Workshop; Los Gatos, CA; October, 2015  P.B. Hugge, “Field results demonstrate reliability gains through improved cooling”, Aerospace and Electronics Conference, 1994. NAECON 1994., Proceedings of the IEEE 1994 National; Dayton, OH; May 1994 I actually find it quite interesting that the effect is so strong. 1 degree must be making a significant measurable difference if 10-15 degrees could half the MTBF.